spectral ellipsometry

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Ellipsometry — is a versatile and powerful optical technique for the investigation of the dielectric properties (complex refractive index or dielectric function) of thin films. It has applications in many different fields, from semiconductor physics to… … Wikipedia
Mehrdad Nikoonahad — Dr. Mehrdad Nikoonahad is an Iranian American electrical engineer, innovator and technologist.[1] Background and education Dr. Nikoonahad received his B.Sc. and Ph.D. degrees in Electronic Engineering from University College London (UCL), England … Wikipedia
Refractive index — Refraction of light at the interface between two media. In optics the refractive index or index of refraction of a substance or medium is a measure of the speed of light in that medium. It is expressed as a ratio of the speed of light in vacuum… … Wikipedia
Polarization — ( Brit. polarisation) is a property of waves that describes the orientation of their oscillations. For transverse waves, it describes the orientation of the oscillations in the plane perpendicular to the wave s direction of travel. Longitudinal… … Wikipedia
surface analysis — ▪ chemistry Introduction in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… … Universalium

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